Transient photoluminescence (trPL) characterization experiments allow to analyze charge carrier dynamics and identify the recombination channels of the device structure under investigation.

Useful information that can be extracted includes the quantification of radiative and non-radiative lifetimes, charge carrier extraction from differential lifetime computation, and the influence of the interfaces on the recombination mechanism. Fitting the experimental results with simulations further supports the analysis of the obtained data. However, qualitatively comparable fittings can be obtained with different sets of simulation parameters.

Using the fully-coupled, 1-dimensional optoelectronic simulation software Setfos, the trPL signal of a simple glass/perovskite structure was simulated and a routine is suggested to ascertain the reliability of the results. This routine is based on experimentally measured material properties and the analysis of the band diagram evolution during the photoluminescence transient. The validity of the simulated trPL is also recursively verified by fitting the decay with a bi-exponential function to extract the lifetimes of the recombination mechanisms.

Check the full tutorial here: https://www.fluxim.com/transient-photoluminescence-perovskite-pvs