M. Diethelm, A. Devižis, W.-H. Hu, T. Zhang, R. Furrer, C. Vael, S. Jenatsch, F. Nüesch, R. Hany
Adv. Funct. Mater. 2022, 32, 2203643. https://doi.org/10.1002/adfm.202203643
This research investigates the impact of electron and hole traps on the performance and lifespan of polymer light-emitting electrochemical cells (PLECs). The study aims to identify and analyze the role of these traps in PLECs, drawing parallels with their known impact on polymer light-emitting diodes (PLEDs).
The researchers fabricated PLECs using a super yellow (SY) polymer as the emitting material and employed various experimental techniques, including electrical driving and breaks, light irradiation, and long-term absorption and capacitance measurements. Optical and electrical simulations using Setfos provided further insights into device behavior.
The findings reveal that electron traps in PLECs share similar characteristics with those in PLEDs, suggesting a common origin in the semiconducting polymer. Notably, the study identifies two types of hole traps in PLECs: one type present in the intrinsic region, mirroring PLED behavior, and another type forming at the interface of the intrinsic and p-doped regions, specific to the PLEC architecture.
This research highlights the significant role of charge traps in limiting PLEC performance and longevity. The findings emphasize the need for strategies beyond conventional approaches to enhance PLEC stability, urging a focus on addressing the fundamental limitations posed by charge traps within the light-emitting polymer itself.
How Setfos Was Used
Setfos was used to perform optical and electrical simulations of the PLEC devices to better understand their properties, such as luminance versus emitter position.
How Paios Was Used
Paios was used to perform several different types of measurements on the PLEC devices:
Impedance measurements: Specifically, impedance measurements at 0 V with an alternating 70 mV signal were taken to determine the capacitance transients of the devices.
Current and light intensity transient measurements: The Paios measurement system was also used to measure how the current and light intensity changed over time. The light intensity was measured by using a photodiode to measure the photovoltage, and the relationship between the measured photovoltage and the corresponding radiance/luminance is explained in a different source.
How Phelos Was Used
Phelos was used to take angular-dependent electroluminescence (EL) measurements of the PLEC devices.