Degradation of Perovskite Photovoltaics Manifested in the Cross- Sectional Potential Profile Studied by Quantitative Kelvin Probe Force Microscopy
Maki Hiraoka, Nobuyuki Ishida, Akio Matsushita, Ryusuke Uchida, Takeyuki Sekimoto, Teruaki Yamamoto, Taisuke Matsui, Yukihiro Kaneko, Kenjiro Miyano, Masatoshi Yanagida, and Yasuhiro Shirai
CS Appl. Energy Mater. 2022, 5, 4, 4232–4239
Kelvin probe force microscopy has been employed to monitor the cross-sectional potential profile in lead-halide perovskite photovoltaic cells. From systematic investigations on many devices under varying bias voltage and light illumination conditions, we are able to deduce quantitative profile features with low noise that allows us to compare the local electronic properties in the working devices against numerical calculations.
The research team applied this technique to devices before and after degradation. Through the profile change before and after, we located the degraded components and inferred the source of the loss of the performance.
Setfos was used to simulate the photovoltaic actions of the device.