Pinpointing the origin of the increased driving voltage during prolonged operation in a phosphorescent OLED based on an exciplex host

PaperSetfosPaios
Written By Fluxim AG

Markus Regnat, Chang-Ki Moon, Sandra Jenatsch, Beat Ruhstaller, Kurt P. Pernstich,

Organic Electronics, Volume 108, 2022, 106570, ISSN 1566-1199,

https://doi.org/10.1016/j.orgel.2022.106570.

Highlights

• Increased driving voltage after prolonged operation.

• Radiant flux remained constant, so an electrical model is sufficient.

• Using multiple measurement methods, determine reliable model parameters.

• Sensitivity analysis reveals the origin of the increased driving voltage.

• Hole traps in TAPC are the main cause of the increased driving voltage.

Fluxim’s all-in-one measurement system, Paios, equipped with a temperature module and a photomultiplier from Hamamatsu (H11526 Series), was used to measure OLED characteristics.

Fluxim's Characterization Suite software (version 4.3) was used to analyze the obtained data, which included the Setfos-Paios-Integration feature for performing model parameter optimizations for fitting the measured data.

Fluxim AG
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