OLEDs made by thermally-activated delayed fluorescence (TADF) materials as emitters promise an IQE of 100%. Here, we want to present an analysis of the influence of non-radiative recombination rates (knrs and knrt) on the device efficiency as well as how to determine them from experiments. As we will see, the knr rate influences PLQY, and consequently ELQY, hence the negative impact on EQE.
First, to determine the non-radiative decay rates, we need to extract the rates kf, krisc, and kisc by fitting transient photoluminescence (trPL) measurements of TADF films.

We present a combined experimental/simulation analysis of a set of 4 OLEDs with 2 systematically varied guest dopants in the EML. A numerical electro-optical model is employed, demonstrating one consistent parameter set that describes both steady-state and AC characteristics of all devices. The model accounts for charge transport, trapping, polar layers, and excitonic loss processes. These are inducing an efficiency roll-off that can be correlated with the shape of the emission zone and the guest dopant concentrations. Furthermore, starting from the resulting parameter set, we show routes for optimized TADF OLDEs with a reduced roll-off.