The Intrinsic Photoluminescence Spectrum of Perovskite Films
Tom P. A. van der Pol, Kunal Datta, Martijn M. Wienk, and René A. J. Janssen
Adv. Optical Mater. 2022, 2102557
doi.org/10.1002/adom.202102557
Photoluminescence (PL) helps you determine material properties and dynamic effects in #perovskite devices. But it is not easy to interpret PL spectra of #perovskites and get to the intrinsic material properties. This work is showing you how to do it.
The group of Prof. Rene Janssen at the Eindhoven University of Technology developed an optical model to quantify the intrinsic PL of a perovskite film and determine the influence of the extrinsic factors on the measured PL. The model is based on film thickness, refractive index, extinction coefficient, and carrier diffusion length as input parameters. The authors concluded that the largest mismatch between intrinsic and measured PL is observed for materials with a long diffusion length (>0.5um) and a layer thickness of >300nm.
The simulation software Setfos was instrumental in calculating an accurate emission spectrum to quantify the intrinsic PL for the perovskite. The simulation uses the real nk spectra of the materials and layer thickness as an input, which is the key to resolving the optical system.
The description you find in this paper can be used as a protocol to analyze your PL data on perovskite films.