Electron Trap Dynamics in Polymer Light-Emitting Diodes
Matthias Diethelm, Michael Bauer, Wei-Hsu Hu, Camilla Vael, Sandra Jenatsch
Adv. Funct. Mater. 2022, 2106185
In this paper the researchers investigate electron trap dynamics in SY PLEDs and discover a recovery feature of the traps during stress interruption. Formation of this trap states takes several minutes. Same behaviour was found for P3HT, MEH-PPV.
The optical and electrical characterization tool Paios was used to stress the PLED and investigate trap dynamics with/without light bias. Additionally TEL experiments show an overshoot if the break time between stressing is extended. Transient Setfos simulations for fast trap dynamics and steady-state voltage depending on Nt.